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 K3N6C4000E-DC
32M-Bit (2Mx16) CMOS MASK ROM
FEATURES
* 2,097,152x16 bit organization * Fast access time 100ns(Max.) : CL=50pF 120ns(Max.) : CL=100pF * Supply voltage : single +5V * Current consumption Operating : 50mA(Max.) Standby : 50A(Max.) * Fully static operation * All inputs and outputs TTL compatible * Three state outputs * Package -. K3N6C4000E-DC : 42-DIP-600
CMOS MASK ROM
GENERAL DESCRIPTION
The K3N6C4000E-DC is a fully static mask programmable ROM organized 2,097,152x16 bit. It is fabricated using silicongate CMOS process technology. This device operates with a 5V single power supply, and all inputs and outputs are TTL compatible. Because of its asynchronous operation, it requires no external clock assuring extremely easy operation. It is suitable for use in program memory of microprocessor and data memory, character generator. The K3N6C4000E-DC is packaged in a 42-DIP.
FUNCTIONAL BLOCK DIAGRAM
PIN CONFIGURATION
A20 . . . . . . . . A0
X BUFFERS AND DECODER
MEMORY CELL MATRIX (2,097,152x16)
A18 A17 A7 A6 A5 A4
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21
42 A19 41 A8 40 A9 39 A10 38 A11 37 A12 36 A13 35 A14 34 A15
Y BUFFERS AND DECODER
SENSE AMP. BUFFERS
A3 A2 A1 A0 CE
DIP
33 A16 32 A20 31 VSS 30 Q15 29 Q7 28 Q14 27 Q6 26 Q13 25 Q5 24 Q12 23 Q4 22 VCC
...
VSS OE
CE OE
CONTROL LOGIC
Q0
Q15
Q0 Q8 Q1 Q9 Q2 Q10
Pin Name A0 - A20 Q0 - Q15 CE OE VCC VSS
Pin Function Address Inputs Data Outputs Chip Enable Output Enable Power (+5V) Ground
Q3 Q11
K3N6C4000E-DC
K3N6C4000E-DC
ABSOLUTE MAXIMUM RATINGS
Item Voltage on Any Pin Relative to VSS Temperature Under Bias Storage Temperature Symbol VIN TBIAS TSTG Rating
CMOS MASK ROM
Unit V C C
-0.3 to +7.0 -10 to +85 -55 to +150
NOTE : Permanent device damage may occur if "ABSOLUTE MAXIMUM RATINGS" are exceeded. Functional operation should be restricted to the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS(Voltage reference to VSS, TA=0 to 70C)
Item Supply Voltage Supply Voltage Symbol VCC VSS Min 4.5 0 Typ 5.0 0 Max 5.5 0 Unit V V
DC CHARACTERISTICS
Parameter Operating Current Standby Current(TTL) Standby Current(CMOS) Input Leakage Current Output Leakage Current Input High Voltage, All Inputs Input Low Voltage, All Inputs Output High Voltage Level Output Low Voltage Level Symbol ICC ISB1 ISB2 ILI ILO VIH VIL VOH VOL IOH=-400A IOL=2.1mA Test Conditions Cycle=5MHz, all outputs open CE=OE=VIL, VIN=0.6V to 2.4V (AC Test Condition) CE=VIH, all outputs open CE=VCC, all outputs open VIN=0 to VCC VOUT=0 to VCC Min 2.2 -0.3 2.4 Max 50 1 50 10 10 VCC+0.3 0.8 0.4 Unit mA mA A A A V V V V
NOTE : Minimum DC Voltage(VIL) is -0.3V an input pins. During transitions, this level may undershoot to -2.0V for periods <20ns. Maximum DC voltage on input pins(VIH) is VCC+0.3V which, during transitions, may overshoot to VCC+2.0V for periods <20ns.
MODE SELECTION
CE H L L OE X H L Mode Standby Operating Operating Data High-Z High-Z Dout Power Standby Active Active
CAPACITANCE(TA=25C, f=1.0MHz)
Item Output Capacitance Input Capacitance Symbol COUT CIN Test Conditions VOUT=0V VIN=0V Min Max 12 12 Unit pF pF
NOTE : Capacitance is periodically sampled and not 100% tested.
K3N6C4000E-DC
CMOS MASK ROM
AC CHARACTERISTICS(TA=0C to +70C,VCC=5V10%, unless otherwise noted.)
TEST CONDITIONS
Item Input Pulse Levels Input Rise and Fall Times Input and Output timing Levels Output Loads Value 0.6V to 2.4V 10ns 0.8V and 2.0V 1 TTL Gate and CL=50pF or 100pF
READ CYCLE
Item Read Cycle Time Chip Enable Access Time Address Access Time Output Enable Access Time Output or Chip Disable to Output High-Z Output Hold from Address Change Symbol tRC tACE tAA tOE tDF tOH 0 K3N6C4000E-DC10 (CL=50pF) Min 100 100 100 50 20 0 Max K3N6C4000E-DC12 (CL=100pF) Min 120 120 120 60 20 0 Max K3N6C4000E-DC15 (CL=100pF) Min 150 150 150 70 30 Max ns ns ns ns ns ns Unit
TIMING DIAGRAM
READ
ADD
ADD1 tRC tACE
ADD2 tDF(Note)
CE tOE OE tOH DOUT VALID DATA VALID DATA tAA
NOTE : tDF is defined as the time at which the outputs achieve the open circuit condition and is not referenced to VOH or VOL level.


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